1. <A> Structured approach to systems testing
Author: William E. Perry
Library: Central Library and Information Center of Shahed University (Tehran)
Subject: Computer programs- Testing,Electronic digital computers- Testing
Classification :
QA
،
76
.
6
،.
P468
،
1988
2. Algorithms for synthesis and testing of asynchronous circuits
Author: Lavagno, Luciano
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Electronic digital computers - Circuits - Testing , Electronic digital computers - Circuits - Mathematical models, Asynchronous circuits - Testing, Asynchronous circuits - Mathematical models
Classification :
TK
7888
.
4
.
L38
3. Analog and mixed-signal boundary-scan
Author: / Adam Osseiran, editor
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject: Printed circuits--Testing--Standards,Boundary scan testing.,Mixed signal circuits--Testing,Electronic digital computers--Circuits--Design and construction,Boundary scan testing.,Mixed signal circuits--Testing,Printed circuits--Testing--Standards,Electronic digital computers--Circuits--Design and construction
Classification :
TK
,
7868
,.
P7
,
A53
,
1999
4. Analog and mixed-signal boundary-scan :
Author: / edited by Adam Osseiran
Library: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
Subject: Printed circuits , Testing , Standards,Boundary scan testing,Mixed signal circuits , Testing,Electronic digital computers , Circuits , Design and construction
Classification :
E-BOOK
5. Checking Experiments in Sequential Machines
Author: / Asok Bhattacharyya
Library: Tehran University, technical faculty libraries 1 (Tehran)
Subject: Fault tolerant computing,Sequential machine theory,Electronic digital computers-Testing
Classification :
QA
76
.
9
.
F38B47
1989
6. Computer Technicians' handbook
Author: Ward, Brice
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Electronic digital computers - Testing
Classification :
TK
7888
.
3
.
W258
7. Designing, testing, and diagnostics- join them
Author: International Test conference )3991: Baltimore, Md.(
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Integrated circuits- Testing- congresses,، Electronic digital computers- Circuits- Testing-Congresses
Classification :
TK
7874
.
I474
1993
8. Digital hardware testing. transistor-level fault modeling and testing
Author: Rajsuman, Rochit., Rochit Rajsuman
Library: Library and Documentation Center of Kurdistan University (Kurdistan)
Subject: ، Electronic digital computers- Circuits- Testing- Data processing,، Integrated circuits- Very large scale integration- Testing- Data processing,، Electric fault location
Classification :
TK
7888
.
4
.
R35
9. Electronic fault diagnosis
Author: Loveday, G.
Library: Central Library and Documentation Center (Kerman)
Subject: Testing ، Electronic digital computers
Classification :
TK
7887
.
L65
1988
10. Fault detection in digital circuits
Author: Friedman, Arthur D.
Library: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
Subject: ، Electronic digital computers - Testing
Classification :
TK
7887
.
F75
11. Fault detection in digital circuits
Author: / (by) Arthur D. Friedman (and) Premachandran R. Menon
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Electronic digital computers - Circuits - Testing,Electric fault location
Classification :
TK
7887
.
F75
12. Fault detection in digital circuits
Author: / Arthur D. Friedman, Premachandran R. Menon
Library: Central Library and Archive Center of shahid Beheshti University (Tehran)
Subject: Electronic digital computers - Testing
Classification :
621
.
3819
58
35
Fr-F
13. Fault detection in digital circuits
Author: Friedman, Arthur D
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Electronic digital computers-- Testing
Classification :
TK
7887
.
F75
14. Fault diagnosis of digital systems
Author: Chang, Herbert Y.
Library: Central Library of Sharif University of Technology (Tehran)
Subject: ، Electronic digital computers-- Testing
Classification :
TK
7887
.
C47
15. Fault diagnosis of digital systems
Author: CHANG,HERBERT Y
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: ELECTRONIC DIGITAL COMPUTERS-TESTING
Classification :
TK
7887
.
C47
16. Handbook of computer troubleshooting & maintenance
Author: MAGUIRE,BYRON W
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: ELECTRONIC DIGITAL COMPUTERS-TESTING , ELECTRONIC DIGITAL COMPUTERS-MAINTENANCE , ELECTRONIC DIGITAL COMPUTERS-
Classification :
TK
7887
.
M35
17. Models in hardware testing
Author: / edited by Hans-Joachim Wunderlich
Library: Central Library and Document Center of Shahid Chamran University (Khuzestan)
Subject: Electronic digital computers--Circuits--Testing,Integrated circuits--Verification,Integrated circuits--Computer simulation
Classification :
TK
,
7888
.
4
,.
M63
,
2010
18. Models in hardware testing
Author:
Library: Central Library and Documents Center of Mazandaran University (Mazandaran)
Subject: Electronic digital computers ; Circuits ; Testing. ; Integrated circuits ; Verification. ; Integrated circuits ; Computer simulation. ;
19. Program style, design, efficiency, debugging, and testing
Author: Van Tassel, Dennie
Library: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
Subject: Programming ، Electronic digital computers,، Debugging in computer science,Testing ، Computer programs
Classification :
QA
76
.
6
.
V37
1978
20. Program style, design, efficiency, debugging and testing
Author: / Dannie Van Tassel
Library: Central Library and Archive Center of shahid Beheshti University (Tehran)
Subject: Electronic digital computers - Programming,Debugging in computer sciences,Computer program - Testing
Classification :
001
.
642
V217
